X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.6 298 PEG 4000, 200mM sodium acetate, pH 7.6, VAPOR DIFFUSION, HANGING DROP, temperature 298K
Unit Cell:
a: 52.550 Å b: 54.810 Å c: 90.500 Å α: 87.68° β: 87.64° γ: 65.14°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.06 Solvent Content: 40.26
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 1.95 19.42 64071 3246 ? 0.1740 0.1979 25.10
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.95 50 95.5 0.037 0.037 23.8 ? ? 64071 2 2 22.00
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.95 2 86.6 ? 0.119 9.9 ? 8391
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID14-4 0.9792 ESRF ID14-4
Software
Software Name Purpose Version
DNA data collection .
SHELXS phasing .
BUSTER refinement 2.8.0
XDS data reduction .
XDS data scaling .
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