X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 292 25% (W/V) PEG 4000, 0.1 M TRIS PH 8.5, 0.2 M calcium chloride, VAPOR DIFFUSION, HANGING DROP, temperature 292K
Unit Cell:
a: 31.493 Å b: 66.681 Å c: 72.999 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 2.050 Solvent Content: 40.000
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.300 20.000 37648 1881 100.000 0.175 0.213 18.141
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.300 20.000 97.400 0.037 0.037 40.200 4.500 37730 37730 0.00 0.00 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.30 1.32 77.80 ? 0.213 3.0 3.20 1469
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.000000 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X6A 0.9537 NSLS X6A
Software
Software Name Purpose Version
MOLREP phasing .
REFMAC refinement 5.5.0109
PDB_EXTRACT data extraction 3.100
HKL-2000 data collection .
HKL-2000 data reduction .
HKL-2000 data scaling .