X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.7 293 0.1M MES pH 6.7, 14-16% PEG 4K and 10mM zinc chloride, VAPOR DIFFUSION, HANGING DROP, temperature 293K
Unit Cell:
a: 123.241 Å b: 61.856 Å c: 89.066 Å α: 90.00° β: 119.20° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 3.39 Solvent Content: 63.68
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION using XT6 native phases, rigid body and annealing refinement. THROUGHOUT 1.70 39.840 60497 3060 93.8 ? 0.236 23.9
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.70 39.849 97.3 ? 0.084 22.4 6.5 ? 62736 ? ? 20.6
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.70 1.73 74.4 ? 0.354 2.63 3.7 2383
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X10SA 0.978 SLS X10SA
Software
Software Name Purpose Version
HKL-2000 data collection .
CNS refinement .
DENZO data reduction .
SCALEPACK data scaling .
CNS phasing .