X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.8 298 0.1M Bis-TrispH 6.8, 10% MPD, 0.2M Ammonium acetate, VAPOR DIFFUSION, SITTING DROP, temperature 298K
Unit Cell:
a: 79.668 Å b: 220.961 Å c: 136.742 Å α: 90.00° β: 103.08° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 3.41 Solvent Content: 63.98
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 2.38 38.824 181735 9099 98.75 0.2265 0.2684 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.38 50.0 99 0.1 ? 3.75 6.8 ? 182058 2.38 2.38 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 5.0.2 .99 ALS 5.0.2
Software
Software Name Purpose Version
PHENIX refinement 1.6.1_357
CNS refinement .
REFMAC refinement 5.2.0019
HKL-2000 data reduction .
HKL-2000 data scaling .
CNS phasing .
HKL-2000 data collection .