X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 294.15 0.2M Ammonium sulfate; 30% PEG 8000; 0.1M Sodium cacodylate, pH 6.5, vapor diffusion, hanging drop, temperature 294.15K
Unit Cell:
a: 59.041 Å b: 60.507 Å c: 60.660 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 2 21 21
Crystal Properties:
Matthew's Coefficient: 2.15 Solvent Content: 42.90
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.900 30.253 17679 1222 99.890 0.188 0.228 32.659
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.900 30.253 99.900 0.137 ? 11.8 9.500 17712 17712 0.7 0.7 18.8
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.90 2.00 100 ? ? 5.4 9.6 2525
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-D 1.078 APS 21-ID-D
Software
Software Name Purpose Version
MOSFLM data reduction .
SCALA data scaling 3.3.9
PHASER phasing 2.1.4
PHENIX refinement 1.6_289
PDB_EXTRACT data extraction 3.100
HKL-2000 data collection .