ISDA

3M4T

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	4.3	295	0.25 M sodium sulfate, 0.1 M sodium acetate pH 4.3, 13% (w/v) PEG 3350, VAPOR DIFFUSION, HANGING DROP, temperature 295K

Unit Cell:

a: 117.208 Å b: 117.208 Å c: 38.405 Å α: 90.00° β: 90.00° γ: 120.00°

Symmetry:

Space Group: P 62 2 2

Crystal Properties:

Matthew's Coefficient: 2.75 Solvent Content: 55.25

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	THROUGHOUT	2.05	29.3	9612	488	98.62	0.19314	0.24181	28.704

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
2.05	29.3	98.6	?	0.065	51.82	20.95	?	10103	?	-3.00	?

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	2.05	2.12	97.7	?	0.347	8.43	?	980

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	NSLS BEAMLINE X8C	1.10	NSLS	X8C

Software