X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.5 288 25% PEG4000, 200mM ammonium acetate, 100 mM Na-acetate, pH 4.5, VAPOR DIFFUSION, SITTING DROP, temperature 288K
Unit Cell:
a: 45.672 Å b: 73.522 Å c: 53.282 Å α: 90.00° β: 109.85° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.49 Solvent Content: 50.57
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION AB INITIO FREE R 1.80 10.00 30201 ? 99.8 0.170 0.217 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.79 30 98.7 ? 0.071 26.0 7.2 30406 30406 0 0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.79 1.82 77.5 ? 0.24 7.2 6.1 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SEALED TUBE ? 1.5418 ? ?
Software
Software Name Purpose Version
MAR345dtb data collection .
HKL2Map model building .
SHELXL-97 refinement .
HKL-2000 data reduction .
HKL-2000 data scaling .
SHELX phasing .
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