X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.15 291 18% PEG 3350, 0.2M Ca acetate, 0.1M MES, pH 6.15, VAPOR DIFFUSION, HANGING DROP, temperature 291K
Unit Cell:
a: 210.585 Å b: 60.327 Å c: 73.122 Å α: 90.00° β: 97.47° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.22 Solvent Content: 44.68
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 1.695 45.244 191496 9525 96.74 0.1486 0.1903 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.695 500 97.3 0.092 ? 15.2 3.2 197594 192259 0.0 0.0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.70 1.76 92.1 ? ? 2.2 2.7 19695
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X4A 0.97918 NSLS X4A
Software
Software Name Purpose Version
HKL-2000 data collection .
SHELXDE phasing .
PHENIX model building .
PHENIX refinement (phenix.refine: 1.5_2)
DENZO data reduction .
SCALEPACK data scaling .
PHENIX phasing .