ISDA: 3LR0

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	4.2	289	Crystal originally grown in JCSG+ condition a6, 0.1M phosphate-citrate pH 4.2, 0.2 M lithium sulfate, 25% PEG 1000 then soaked and cryo-protected into 0.1 M Na citrate pH 4.5, 1.0 M KI, 30% PEG 1000 for 1 hour prior to vitrification; crystal tracking IDs 203087a6 for growth and 206239a1 for soak; affinity tag not removed prior to crystallization, VAPOR DIFFUSION, SITTING DROP, temperature 289K

Unit Cell:

a: 58.360 Å b: 58.360 Å c: 75.690 Å α: 90.000° β: 90.000° γ: 120.000°

Symmetry:

Space Group: P 32 2 1

Crystal Properties:

Matthew's Coefficient: 2.26 Solvent Content: 45.64

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	SAD	THROUGHOUT	1.900	19.10	12191	585	99.840	0.213	0.254	18.791

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
1.900	19.10	99.800	0.046	?	25.450	11.2	12212	12191	?	-3.00	32.657

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	1.90	1.95	99.90	?	?	4.1	8.9	925

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
ROTATING ANODE	RIGAKU MICROMAX-007 HF	1.5418	?	?

Software