X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.6 295 PEG 3350 25%, NaCl 0.2M, Na citrate 0.1M pH 5.6, VAPOR DIFFUSION, temperature 295K
Unit Cell:
a: 41.590 Å b: 41.590 Å c: 171.198 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 32 2 1
Crystal Properties:
Matthew's Coefficient: 2.09 Solvent Content: 41.17
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 1.75 50.00 17118 921 98.83 0.21321 0.24282 49.335
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.75 50.0 98.8 0.090 0.090 48.5 8.7 18174 18174 0 -3.0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.75 1.78 91.3 ? 0.540 2.50 6.3 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.9793 APS 19-ID
Software
Software Name Purpose Version
HKL-3000 data collection .
HKL-3000 phasing .
SHELXD phasing .
SHELXE model building .
MLPHARE phasing .
DM model building .
SOLVE phasing .
RESOLVE model building .
CCP4 model building .
ARP/wARP model building .
REFMAC refinement 5.5.0072
Coot model building .
HKL-2000 data reduction .
HKL-2000 data scaling .
DM phasing .
RESOLVE phasing .
CCP4 phasing .