X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 291 20% PEG 3350, 0.2M ammonium tartrate, 4% N-propanol, VAPOR DIFFUSION, SITTING DROP, temperature 291K
Unit Cell:
a: 60.866 Å b: 83.128 Å c: 96.678 Å α: 90.00° β: 98.13° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 1.95 Solvent Content: 36.81
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.250 48.790 84557 4191 94.900 ? 0.210 23.400
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.25 500 99.1 0.083 ? 18.5 3.6 89029 88228 0.0 0.0 14.300
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.25 2.33 98.7 ? ? 4.9 3.3 8877
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X4A 0.97853 NSLS X4A
Software
Software Name Purpose Version
CNS refinement 1.2
PDB_EXTRACT data extraction 3.00
HKL-2000 data collection .
DENZO data reduction .
SCALEPACK data scaling .
AutoSol phasing .
REFMAC refinement .
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