X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 293 18% PEG3350, 0.1M Ammonium Tartrate, 5 mM CaCl2, 5 mM AMPPNP, 1 mM MgCl2, VAPOR DIFFUSION, SITTING DROP, temperature 293K
Unit Cell:
a: 57.080 Å b: 88.060 Å c: 58.610 Å α: 90.00° β: 118.07° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.30 Solvent Content: 46.46
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.90 19.56 40168 2013 99.1 ? 0.2286 44.82
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.9 20 99.1 ? 0.0483 12.45 7.39 40599 40219 ? ? 29.14
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.90 2.00 94.4 ? 0.4089 2.63 6.67 5955
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 23-ID-B 0.97948 APS 23-ID-B
Software
Software Name Purpose Version
Locally data collection modified Blu-Ice GUI interface to EPICS control
BALBES phasing .
BUSTER refinement 2.8.0
XDS data reduction .
XDS data scaling .
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