X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.5 289 30-40%(v/v) PEG 300, 0.1M NaAc pH4.5, 0.2M NaCl, 2mM DTT, VAPOR DIFFUSION, HANGING DROP, temperature 289K
Unit Cell:
a: 67.506 Å b: 85.624 Å c: 171.959 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: C 2 2 21
Crystal Properties:
Matthew's Coefficient: 2.29 Solvent Content: 46.30
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 1.90 50 37279 1972 98.93 0.21712 0.26397 40.814
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.90 50.00 99.0 0.090 ? 18.2 10.7 ? 39299 ? ? 85.7
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.90 1.93 98.2 ? ? 4.5 7.9 1931
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRF BEAMLINE BL17U 0.9791, 0.9792, 0.9795, 0.9700 SSRF BL17U
Software
Software Name Purpose Version
MAR345dtb data collection .
SHELXD phasing .
REFMAC refinement 5.5.0066
HKL-2000 data reduction .
SCALA data scaling .