X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.6 298 6% PEG 8000, 0.1M LiCl, pH 5.6, VAPOR DIFFUSION, SITTING DROP, temperature 298K
Unit Cell:
a: 94.530 Å b: 107.710 Å c: 154.100 Å α: 90.01° β: 90.10° γ: 104.70°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 3.44 Solvent Content: 64.27
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 3.500 47.991 71363 3574 96.28 0.2055 0.2389 59.526
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.5 48.0 96.2 0.179 ? 8.9 3.8 ? 71365 0.0 -3.0 57.53
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.5 3.62 74.9 ? ? 3.6 2.7 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID14-4 0.9395 ESRF ID14-4
Software
Software Name Purpose Version
PHENIX refinement 1.6_288
PDB_EXTRACT data extraction 3.005
XDS data scaling .
XDS data reduction .
XSCALE data scaling .
PHASER phasing .