X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 293.15 250mM triNa citrate, 22% PEG 3350, 5mM MgCl2, vapor diffusion, hanging drop, temperature 293.15K
Unit Cell:
a: 50.280 Å b: 58.520 Å c: 87.120 Å α: 90.000° β: 83.880° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 1.88 Solvent Content: 34.46
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.293 48.492 22077 1105 96.970 0.176 0.226 47.255
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.290 49.999 96.600 ? 0.054 18.250 ? 22781 22081 ? -3.00 45.743
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.29 2.43 91.80 ? 0.401 4.5 ? 3362
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-ID 0.999 APS 22-ID
Software
Software Name Purpose Version
XSCALE data scaling .
PHASER phasing 1.3.2
PHENIX refinement .
PDB_EXTRACT data extraction 3.005
SERGUI data collection .
XDS data reduction .
XDS data scaling .
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