X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.0 294 200MM SODIUM ACETATE, PH 4.6, 100MM TRIS-HCL, PH 8.5, 10% GLYCEROL, 30% PEG4000, VAPOR DIFFUSION, SITTING DROP, TEMPERATURE 294K
Unit Cell:
a: 67.310 Å b: 75.712 Å c: 77.438 Å α: 106.41° β: 115.49° γ: 96.71°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.62 Solvent Content: 53.04
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.30 20.00 52491 1661 95.90 0.19504 0.25436 36.962
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.300 50.000 99.8 0.1400 ? 3.5000 3.900 ? 56552 ? -5.000 31.580
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.30 2.36 98.8 ? ? 1.100 3.90 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 31-ID ? APS 31-ID
Software
Software Name Purpose Version
SHELX model building .
REFMAC refinement 5.3.0034
HKL-2000 data reduction .
HKL-2000 data scaling .
SHELX phasing .
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