X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.9 293 0.2 M Ca acetate, 0.1 M Na cacodilate, 9% PEG 8K, pH 6.9, VAPOR DIFFUSION, SITTING DROP, temperature 293K
Unit Cell:
a: 59.766 Å b: 92.040 Å c: 96.210 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 2.41 Solvent Content: 48.87
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.00 50.00 34327 1714 93.860 0.187 0.239 13.14
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.000 50.000 93.7 0.09100 0.09100 21.8850 6.500 34443 34443 0 -3.000 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.00 2.03 88.0 ? 0.51300 2.800 5.90 1520
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.9786 APS 19-ID
Software
Software Name Purpose Version
HKL-3000 data collection .
HKL-3000 phasing .
MLPHARE phasing .
DM model building .
SHELXD phasing .
RESOLVE model building .
ARP/wARP model building .
REFMAC refinement 5.5.0072
Coot model building .
HKL-3000 data reduction .
HKL-2000 data scaling .
DM phasing .
RESOLVE phasing .