X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.0 292 0.2M Ammonium Citrate pH 7.0 8% W/V Trimethylamine N-oxide dihydrate 20% W/V PEG 3,350, VAPOR DIFFUSION, SITTING DROP, temperature 292K
Unit Cell:
a: 145.564 Å b: 145.564 Å c: 126.401 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 63 2 2
Crystal Properties:
Matthew's Coefficient: 4.87 Solvent Content: 74.75
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.26 44.59 36708 1494 97.9 0.223 0.238 44.3
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.18 50.00 100.0 ? 0.084 13.5 42.9 41573 41573 0.0 0.0 32.2
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.18 2.26 100.0 ? 0.70 11.1 41.9 4078
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X25 0.9792 NSLS X25
Software
Software Name Purpose Version
CBASS data collection .
SHELXCD phasing .
SHARP phasing .
CNS refinement 1.1
DENZO data reduction .
HKL-2000 data scaling .