X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.0 295.5 90mM tripostassium citrate, 100mM sodium acetate, 5% (wt/vol) PEG 6000, pH 4.0, VAPOR DIFFUSION, HANGING DROP, temperature 295.5K
Unit Cell:
a: 158.160 Å b: 158.160 Å c: 166.110 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: H 3 2
Crystal Properties:
Matthew's Coefficient: 4.86 Solvent Content: 74.69
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.400 45.657 30094 1517 95.990 0.199 0.219 64.169
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.4 45.66 96.1 0.080 ? 6.3 3.71 30140 30094 0 0 55.46
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.4 2.49 97.9 ? ? 2.0 5.65 3050
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.9793 APS 19-ID
Software
Software Name Purpose Version
EPICS-based data collection beamline control
data data collection acquisition systems
SHARP phasing .
PHENIX refinement (phenix.refine: 1.4_151)
d*TREK data reduction .
d*TREK data scaling .