3KRS

X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.50 290 MD PACT SCREEN G8: 20% PEG 3350, 100MM BISTRISPROPANE PH 7.5, 200MM NA2SO4, CRPAA.01119.A AT 75 MG/ML, VAPOR DIFFUSION, SITTING DROP, TEMPERATURE 290K
Unit Cell:
a: 53.560 Å b: 71.930 Å c: 75.830 Å α: 90.00° β: 106.47° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.56 Solvent Content: 52.00
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.55 20.0 79284 3990 99.0 0.159 0.188 9.94
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.550 20 99.0 0.07700 ? 12.9300 3.6 80143 79305 0 -3.000 16.19
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.55 1.59 91.3 ? ? 2.900 2.3 5877
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 5.0.3 0.976484 ALS 5.0.3
Software
Software Name Purpose Version
BOS data collection .
PHASER phasing .
REFMAC refinement 5.5.0104
XDS data reduction .
XSCALE data scaling .