X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.65 298 10.5% PEG 550 MME, 10 mM Phenol, 0.1 M sodium acetate, pH 4.65, VAPOR DIFFUSION, HANGING DROP, temperature 298K
Unit Cell:
a: 53.350 Å b: 75.315 Å c: 61.778 Å α: 90.00° β: 106.29° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.12 Solvent Content: 41.98
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 1.58 29.50 59447 3175 96.86 0.19246 0.21252 22.033
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.58 30.0 98.4 ? 0.061 32.1 7.3 62650 62650 1.0 1.0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.6 1.66 97.6 ? 0.329 5.7 7.4 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X3A 0.97561 NSLS X3A
Software
Software Name Purpose Version
CBASS data collection .
HKL2Map model building .
REFMAC refinement 5.5.0072
HKL-2000 data reduction .
HKL-2000 data scaling .
HKL2Map phasing .