X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 297 0.2M Ammonium Acetate, 0.1M This-Cl pH 8.5, 25% PEG 3350, VAPOR DIFFUSION, SITTING DROP, temperature 297K
Unit Cell:
a: 48.212 Å b: 72.462 Å c: 61.737 Å α: 90.00° β: 112.05° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: ? Solvent Content: ?
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 1.95 50 28740 1457 99.58 0.14792 0.19921 10.118
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.95 50 99.9 0.065 ? 55.43 7.4 28802 28761 ? -3 17.9
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.95 1.98 99.4 ? ? 16.76 6.3 1402
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-BM 0.97962 APS 19-BM
Software
Software Name Purpose Version
SBC-Collect data collection .
PHENIX model building .
REFMAC refinement 5.5.0102
HKL-3000 data reduction .
HKL-3000 data scaling .
PHENIX phasing .
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