X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 10.5 277 1.2M Sodium phosphate dibasic/0.8M Potassium phosphate monobasic, CAPS pH 10.5, 0.2M Lithium sulfate, VAPOR DIFFUSION, SITTING DROP, temperature 277K
Unit Cell:
a: 340.068 Å b: 340.068 Å c: 340.068 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: F 4 3 2
Crystal Properties:
Matthew's Coefficient: 4.16 Solvent Content: 70.4
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION ? THROUGHOUT 2.90 36.25 35341 1854 98.46 0.19993 0.24503 12.901
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.900 40.000 98.500 0.149 ? 5.600 9.000 ? 37241 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.90 2.95 99.70 ? ? ? 8.20 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.9794 APS 19-ID
Software
Software Name Purpose Version
DENZO data reduction .
SCALEPACK data scaling .
REFMAC refinement refmac_5.5.0102
PDB_EXTRACT data extraction 3.004
SBC-Collect data collection .
HKL-3000 data reduction .
HKL-3000 data scaling .
SHELX phasing .
DM phasing .
BUCCANEER phasing .
Coot model building .