X-RAY DIFFRACTION
| Crystal ID | Scattering Type | Data Collection Temprature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
|---|---|---|---|---|---|---|---|---|
| 1 | 293 K |
| Source | Type | Wavelength List | Synchrotron Site | Beamline |
|---|---|---|---|---|
| ROTATING ANODE | RIGAKU FR-E DW | 1.54 | ? | ? |
| Software Name | Purpose | Version |
|---|---|---|
| CrystalClear | data collection | . |
| SHELX | model building | . |
| SHELXL-97 | refinement | . |
| CrystalClear | data reduction | . |
| CrystalClear | data scaling | . |
| SHELX | phasing | . |
