X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? ? VAPOR DIFFUSION, HANGING DROP
Unit Cell:
a: 52.676 Å b: 52.619 Å c: 64.834 Å α: 100.32° β: 109.54° γ: 111.62°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.02 Solvent Content: 39.05
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.10 29.58 30366 1614 95.92 0.21510 0.26828 28.461
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.1 30 96.4 0.055 ? ? ? 31986 31986 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.1 2.18 96.2 ? ? ? ? 3155
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SPRING-8 BEAMLINE BL38B1 1 SPring-8 BL38B1
Software
Software Name Purpose Version
MOLREP phasing .
REFMAC refinement 5.5.0072
HKL-2000 data reduction .
HKL-2000 data scaling .