X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 277 0.1M hepes, 1.4M sodium citrate, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 277K
Unit Cell:
a: 51.342 Å b: 67.612 Å c: 116.553 Å α: 90.000° β: 90.120° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.58 Solvent Content: 52.39
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 2.050 47.023 50220 2000 99.910 0.194 0.236 31.351
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.050 47.036 99.900 0.082 0.082 12.900 3.700 50271 50235 2.0 2.0 29.7
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.05 2.16 99.80 ? 0.544 2.1 3.70 7266
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X6A 1.0 NSLS X6A
Software
Software Name Purpose Version
MOSFLM data reduction .
SCALA data scaling 3.2.25
PHASER phasing 1.3.3
PHENIX refinement 1.5_2
PDB_EXTRACT data extraction 3.005
HKL-2000 data collection .