X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.6 294.0 0.2M ammonium dihydrogen phosphate, 20% PEG3350, 1% PEG4000, 1mM magnesium sulfate, and 25mM MES pH 5.6, VAPOR DIFFUSION, SITTING DROP, temperature 294.0K
Unit Cell:
a: 83.112 Å b: 23.194 Å c: 105.624 Å α: 90.000° β: 107.480° γ: 90.000°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.35 Solvent Content: 47.75
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 2.000 27.410 13431 653 98.240 0.242 0.285 24.037
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.000 50.000 99.000 0.067 ? 14.500 5.900 ? 13438 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.00 2.07 91.60 ? ? ? 4.60 1231
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-F 0.97921,0.97942 APS 21-ID-F
Software
Software Name Purpose Version
DENZO data reduction .
SCALEPACK data scaling .
SHARP phasing .
DM phasing 5.0
REFMAC refinement refmac_5.5.0056
PDB_EXTRACT data extraction 3.005
Blu-Ice data collection Max
HKL-2000 data reduction .
HKL-2000 data scaling .