X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.6 293 60% MPD, 100MM NAAC PH 4.6, 10MM CACL2, VAPOR DIFFUSION, HANGING DROP, temperature 293K
Unit Cell:
a: 160.470 Å b: 160.470 Å c: 78.828 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 42 2 2
Crystal Properties:
Matthew's Coefficient: 3.12 Solvent Content: 60.52
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD ? 2.150 46.048 56271 2860 99.78 0.2146 0.2547 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.150 46.048 99.3 ? 0.046 14.95 3.13 ? 56271 ? 3.000 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.15 2.29 98.9 ? 0.454 2.25 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 77.2 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06SA 0.9793 SLS X06SA
Software
Software Name Purpose Version
SHARP phasing .
PHENIX refinement (phenix.refine)
XDS data reduction .
XSCALE data scaling .