X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.0 289 0.2M potassium thiocyanate, 20% PEG 3350, pH 7.0, VAPOR DIFFUSION, SITTING DROP, temperature 289K
Unit Cell:
a: 105.115 Å b: 53.295 Å c: 90.821 Å α: 90.000° β: 112.020° γ: 90.000°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.29 Solvent Content: 46.31
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 2.100 29.600 27351 1379 99.640 0.203 0.242 24.376
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.100 50.000 99.600 0.092 ? 7.800 7.600 27599 27599 ? -3 31.2
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.10 2.14 99.80 ? ? ? 7.00 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-BM 0.97949, 0.97935 APS 19-BM
Software
Software Name Purpose Version
MLPHARE phasing .
DM phasing 6.0
REFMAC refinement .
PDB_EXTRACT data extraction 3.005
HKL-3000 data collection .
HKL-3000 data reduction .
HKL-3000 data scaling .
HKL-3000 phasing .
SHELXD phasing .
SHELXE model building .
SOLVE phasing .
RESOLVE phasing .
ARP/wARP model building .
CCP4 phasing .
O model building .
Coot model building .