X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.5 298 0.1M AMMONIUM ACETATE, 0.1M BIS-TRIS, 17% PEG-10000, pH5.5, batch crystallization, temperature 298K
Unit Cell:
a: 65.822 Å b: 106.119 Å c: 109.097 Å α: 90.000° β: 91.260° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.70 Solvent Content: 54.51
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.000 38.453 99493 4985 98.400 0.162 0.206 29.825
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.000 40.0 98.400 ? 0.075 11.870 3.7 99524 99524 ? -3.00 31.821
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.00 2.17 98.90 ? 0.334 3.6 3.7 21640
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06DA 1.08150 SLS X06DA
Software
Software Name Purpose Version
XSCALE data processing .
PHENIX refinement .
PDB_EXTRACT data extraction 3.005
MAR345dtb data collection .
XDS data reduction .
XDS data scaling .
BALBES phasing .