X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 292 20-21% polyethylene glycol 6000, 9-10% ethylene glycol, 50/100mM ammonium acetate, 2% 2-methyl-2,4-pentanediol, 50mM Tris-HCl, pH7.5, VAPOR DIFFUSION, HANGING DROP, temperature 292K
Unit Cell:
a: 168.476 Å b: 168.476 Å c: 97.020 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: I 41
Crystal Properties:
Matthew's Coefficient: 2.59 Solvent Content: 52.43
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 3.300 44.928 20503 1054 99.92 0.2227 0.2682 142.359
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.300 119.523 99.9 0.092 0.092 13.04 6.3 20529 20507 ? 1.1 110.675
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.3 3.5 100 ? ? 1.16 6.3 3249
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06SA 1.008 SLS X06SA
Software
Software Name Purpose Version
RemDAq data collection .
PHASER phasing .
PHENIX refinement .
XDS data reduction .
XDS data scaling .