ELECTRON MICROSCOPY

Sample

dimeric ATM kinase

Specimen Preperation
Sample Aggregation State PARTICLE
Vitrification Instrument
Cryogen Name
Sample Vitrification Details
3D Reconstruction
Reconstruction Method SINGLE PARTICLE
Number of Particles ?
Reported Resolution (Å) 28
Resolution Method FSC 0.143 CUT-OFF
Other Details ?
Refinement Type
Symmetry Type POINT
Map-Model Fitting and Refinement
ID 1
Refinement Space ?
Refinement Protocol ?
Refinement Target ?
Overall B Value ?
Fitting Procedure ?
Details ?
Data Acquisition
Detector Type GATAN ULTRASCAN 4000 (4k x 4k)
Electron Dose (electrons/Å2) 25
Imaging Experiment
Date of Experiment 2015-09-01
Temprature (Kelvin)
Microscope Model JEOL 2010
Minimum Defocus (nm) 1000
Maximum Defocus (nm) 4000
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS 2.0
Imaging Mode BRIGHT FIELD
Specimen Holder Model ?
Nominal Magnification 50000
Calibrated Magnification ?
Source LAB6
Acceleration Voltage (kV) 200
Imaging Details ?
Imaging Experiment
Task Software Package Version
RECONSTRUCTION SIMPLE ?
RECONSTRUCTION EMAN2 ?
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details