ELECTRON MICROSCOPY


Sample

YiiP from Shewanella oneidensis in DOPG lipids

Specimen Preperation
Sample Aggregation State 2D ARRAY
Vitrification Instrument GATAN CRYOPLUNGE 3
Cryogen Name ETHANE
Sample Vitrification Details Blot for 2-5 seconds before plunging into liquid ethane (Gatan cryoplunger)
3D Reconstruction
Reconstruction Method HELICAL
Number of Particles ?
Reported Resolution (Å) 13
Resolution Method ?
Other Details CRYSTAL CELL PARAMETERS WERE A=57.5, B=34.0, C=100.0, ALPHA=90, BETA=90, GAMMA=85.3.
Refinement Type
Symmetry Type HELICAL
Map-Model Fitting and Refinement
ID 1
Refinement Space REAL
Refinement Protocol FLEXIBLE FIT
Refinement Target ?
Overall B Value ?
Fitting Procedure ?
Details METHOD--MDFF DETAILS--An initial homology model of YiiP from S. oneidensis was built with MODELLER 9v7 using the X-ray crystal structure of YiiP from E. coli (PDB entry 3H90) as a template. This model included 9 residues at the N-terminus and 4 residues at the C-terminus that were not present in the X-ray structure. Initial configurations were obtained by manually placing the symmetry axis of the homology model onto the symmetry axis of the electron density map and aligning the protein C-terminal domains to the corresponding densities. In the first step of the MDFF fitting, harmonic potentials were applied to (a) the four-helix bundle formed by helices M1, M2, M4, and M5 (residues 12-32, 42-65, 119-142, and 147-165, respectively), (b) the M3 and M6 helices at the dimeric interface (residues 78-108 and 179-211, respectively), and (c) the C-terminal intracellular domain (residues 212-297).
Data Acquisition
Detector Type GENERIC FILM
Electron Dose (electrons/Å2) 10
Imaging Experiment
Date of Experiment 2009-02-10
Temprature (Kelvin)
Microscope Model FEI TECNAI F20
Minimum Defocus (nm) 1600
Maximum Defocus (nm) 3000
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS 2.1
Imaging Mode BRIGHT FIELD
Specimen Holder Model ?
Nominal Magnification 50000
Calibrated Magnification 51190
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 200
Imaging Details ?
Imaging Experiment
Task Software Package Version
RECONSTRUCTION EMIP ?
RECONSTRUCTION SPARX ?
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
. Corrected throughout the reconstruction cycle