X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.0 289 32% PEG 1750, 0.125 M lithium sulfate, 10% ethylene glycol, 50 mM CHES, pH 8.0, VAPOR DIFFUSION, HANGING DROP, temperature 289K
Unit Cell:
a: 37.894 Å b: 56.549 Å c: 100.352 Å α: 100.88° β: 90.61° γ: 100.49°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.07 Solvent Content: 40.50
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 1.700 40.676 84786 4271 95.87 0.2045 0.2339 35.1
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.7 40.68 95.9 ? 0.097 7.3 3.8 ? 84818 ? ? 24.7
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.70 1.76 83.0 ? 0.461 1.9 3.6 7211
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 4.2.2 0.9790, 0.9795, 1.0000 ALS 4.2.2
Software
Software Name Purpose Version
SHARP phasing .
PHENIX refinement (phenix.refine: 1.4_4)
d*TREK data reduction .
d*TREK data scaling .