X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.0 295 18% PEG 3350, 0.1M Sodium chloride, 0.01M Tris-HCl, 5% Glycerol, pH 7.0, VAPOR DIFFUSION, SITTING DROP, temperature 295K
Unit Cell:
a: 61.463 Å b: 61.463 Å c: 130.082 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 65
Crystal Properties:
Matthew's Coefficient: 2.15 Solvent Content: 42.87
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 1.45 53.22 46652 2488 100.0 0.169 0.189 16.02
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.45 53.22 100 ? 0.084 18.9 5.7 ? 49268 ? 0 14.68
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.45 1.50 100.0 ? 0.567 2.4 5.3 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON BESSY BEAMLINE 14.2 0.9184, 0.9798, 0.9799 BESSY 14.2
Software
Software Name Purpose Version
MAR345 data collection CCD
SHELXCD phasing .
SHELXE model building .
SHARP phasing .
ARP/wARP model building 7.0.1
REFMAC refinement 5.5.0072
HKL-2000 data reduction .
XDS data reduction .
HKL-2000 data scaling .
XDS data scaling .