X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.0 294 100mM Bis-Tris pH 5.0, 25% PEG 3350, 200mM magnesium chloride, vapor diffusion, temperature 294K
Unit Cell:
a: 51.581 Å b: 52.368 Å c: 60.918 Å α: 94.680° β: 97.680° γ: 90.570°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.24 Solvent Content: 45.03
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.000 20.000 40831 2095 96.040 0.221 0.265 38.873
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.000 29.071 96.000 0.068 0.068 10.2 3.900 42575 40872 0 0 28.8
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.00 2.11 95.6 ? 0.296 3.3 3.9 5948
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 31-ID 0.97958 APS 31-ID
Software
Software Name Purpose Version
SCALA data scaling 3.3.9
REFMAC refinement .
PDB_EXTRACT data extraction 3.005
MAR345 data collection CCD
MOSFLM data reduction .
SHELXCD phasing .
SHELXE model building .