X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.3 290 1.5M SODIUM CITRATE, 50MM BISTRIS PH 6.3; MYTUD.01046.A AT 27MG/ML, , VAPOR DIFFUSION, SITTING DROP, temperature 290K
Unit Cell:
a: 86.450 Å b: 51.010 Å c: 32.570 Å α: 90.00° β: 95.10° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.35 Solvent Content: 47.00
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.00 20 9535 459 98.9 0.185 0.253 12.01
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.000 20 98.8 0.09500 ? 10.1700 3.1 9535 9535 0 -3.000 21.39
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.00 2.05 99.3 ? ? 3.200 3.1 710
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON OTHER 0.81836 ? ?
Software
Software Name Purpose Version
MOLREP phasing .
REFMAC refinement 5.5.0088
XDS data reduction .
XSCALE data scaling .
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