X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.25 293 10-20% (w/v) PEG3350, 100mM BisTris Propane, 200mM Na thiocyanate, pH6.25, VAPOR DIFFUSION, HANGING DROP, temperature 293K
Unit Cell:
a: 86.600 Å b: 86.600 Å c: 166.890 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 32 2 1
Crystal Properties:
Matthew's Coefficient: 2.67 Solvent Content: 53.89
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.550 44.68 24132 1228 99.440 0.231 0.274 48.753
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.550 44.68 99.4 0.042 ? 12.950 3.59 24132 24132 ? -3.00 56.478
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.55 2.62 99.3 ? ? 2.3 3.63 1734
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID14-4 0.9795 ESRF ID14-4
Software
Software Name Purpose Version
XSCALE data scaling .
SHARP phasing .
SOLOMON phasing .
REFMAC refinement .
PDB_EXTRACT data extraction 3.005
XDS data scaling .