X-RAY DIFFRACTION
Crystal ID | Scattering Type | Data Collection Temprature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
---|---|---|---|---|---|---|---|---|
1 | 298.0 K |
Source | Type | Wavelength List | Synchrotron Site | Beamline |
---|---|---|---|---|
SEALED TUBE | ENRAF-NONIUS FR590 | 0.7107 | ? | ? |
Software Name | Purpose | Version |
---|---|---|
HKL-2000 | data collection | . |
CNS | refinement | . |
DENZO | data reduction | . |
SCALEPACK | data scaling | . |
CNS | phasing | . |