X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.6 273 0.1M NA(OAC), 3.2M NACL, pH 4.6, VAPOR DIFFUSION, HANGING DROP, temperature 273K
Unit Cell:
a: 141.833 Å b: 141.833 Å c: 50.283 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: I 4 2 2
Crystal Properties:
Matthew's Coefficient: 3.32 Solvent Content: 62.91
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.30 50.00 11658 568 99.5 0.189 0.214 21.78
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.200 50.000 99.9 0.145 0.145 22.8900 12.900 13438 13438 0 -3.000 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.20 2.24 99.9 ? 0.98 2.200 13.20 654
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-BM 0.9767 APS 19-BM
Software
Software Name Purpose Version
HKL-3000 data collection .
HKL-2000 data reduction .
HKL-3000 phasing .
MLPHARE phasing .
DM model building .
SHELXD phasing .
RESOLVE model building .
ARP model building WARP
Coot model building .
REFMAC refinement 5.5.0072
HKL-3000 data reduction .
HKL-3000 data scaling .
DM phasing .
SHELXE model building .
RESOLVE phasing .
CCP4 phasing .