X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.5 294 0.2M Ammonium acetate, 0.1M Bis-Tris, 25% PEG 3350, pH 5.5, VAPOR DIFFUSION, SITTING DROP, temperature 294K
Unit Cell:
a: 61.805 Å b: 61.626 Å c: 92.907 Å α: 81.75° β: 78.71° γ: 83.79°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.48 Solvent Content: 50.40
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.30 90.54 57758 2941 98.090 0.219 0.262 25.41
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.200 90.540 98.0 0.07000 0.07000 30.0810 3.900 ? 66358 ? -3.000 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.20 2.24 97.6 ? 0.55900 2.000 3.40 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-F ? APS 21-ID-F
Software
Software Name Purpose Version
Blu-Ice data collection Max
HKL-3000 phasing .
MLPHARE phasing .
DM model building .
SHELXD phasing .
RESOLVE model building .
CCP4 model building .
ARP/wARP model building .
Coot model building .
REFMAC refinement 5.5.0051
ADSC data collection .
HKL-2000 data scaling .
DM phasing .
RESOLVE phasing .
ARP model building WARP
CCP4 phasing .