ISDA: 3I17

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	9.5	298	0.1 M Bis-tris-propane, pH 9.5, 30% PEG4000, VAPOR DIFFUSION, HANGING DROP, temperature 298K

Unit Cell:

a: 34.699 Å b: 37.271 Å c: 60.371 Å α: 105.80° β: 106.44° γ: 89.97°

Symmetry:

Space Group: P 1

Crystal Properties:

Matthew's Coefficient: 2.31 Solvent Content: 46.66

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	THROUGHOUT	1.68	35.74	29087	1536	96.61	0.18259	0.23095	30.287

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
1.68	55.56	94.5	0.051	?	20.8	3.8	?	30624	?	1	?

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	1.680	1.724	90.95	?	?	4	4.2	2025

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	APS BEAMLINE 21-ID-D	0.99999	APS	21-ID-D

Software