X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 298 PEG 3000, NaCl, pH 7.5, VAPOR DIFFUSION, temperature 298K
Unit Cell:
a: 87.930 Å b: 57.880 Å c: 75.150 Å α: 90.000° β: 122.850° γ: 90.000°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.19 Solvent Content: 43.81
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD ? 1.69 45.577 67814 6775 97.720 0.169 0.184 32.600
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.69 45.577 97.400 0.048 ? 19.8 5.6 69614 67824 ? -3.00 30.960
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.69 1.80 86.10 ? ? 2.7 4.8 11226
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06SA 0.97930 SLS X06SA
Software
Software Name Purpose Version
XSCALE data scaling .
PHASER phasing .
RESOLVE phasing 2.13
PHENIX refinement .
PDB_EXTRACT data extraction 3.005
MOSFLM data reduction .
XDS data reduction .
XDS data scaling .