X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.6 281 1.2-1.4M potassium formate, 100mM sodium acetate pH 4.6, 5% w/v polyethylene glycol 8000, VAPOR DIFFUSION, HANGING DROP, temperature 281K
Unit Cell:
a: 54.671 Å b: 204.538 Å c: 62.897 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: C 2 2 21
Crystal Properties:
Matthew's Coefficient: 2.26 Solvent Content: 45.62
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 2.80 50.00 8612 441 99.86 0.23826 0.28518 33.642
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.8 50 99.9 0.1 ? 13.9 4.3 16723 16723 1 2.75 54.0
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.8 2.9 100 ? ? 2.75 4.2 1667
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 12.3.1 0.9796, 0.9797 ALS 12.3.1
Software
Software Name Purpose Version
HKL-2000 data collection .
SOLVE phasing .
REFMAC refinement 5.2.0005
HKL-2000 data reduction .
HKL-2000 data scaling .