X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 294 100 mM Tris, 25-30 % PEG 8000, and 200 mM guanadinium chloride, pH 8-9, VAPOR DIFFUSION, HANGING DROP, temperature 294K
Unit Cell:
a: 141.312 Å b: 43.500 Å c: 94.692 Å α: 90.00° β: 112.88° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.22 Solvent Content: 44.56
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD ? 1.6 31.502 68090 3440 95.89 0.1668 0.1982 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.6 50 96.2 0.049 0.043 23.5 4.8 70828 68137 ? 2.4 26.1
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.6 1.66 81.9 ? 0.268 2.4 2.8 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-G 0.9784 APS 21-ID-G
Software
Software Name Purpose Version
HKL-2000 data collection .
SHARP phasing .
PHENIX refinement .
HKL-2000 data reduction .
HKL-2000 data scaling .