X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 291 20% PEG 3350, 0.2M ammonium phosphate, Microbatch under oil, temperature 291K
Unit Cell:
a: 78.543 Å b: 54.029 Å c: 79.584 Å α: 90.000° β: 104.180° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.16 Solvent Content: 43.18
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD ? 1.963 31.447 87331 4393 96.370 0.170 0.178 16.721
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.963 500 96.7 0.041 ? 22.2 1.7 90354 87372 0.0 0.0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.97 2.04 90.4 ? ? 13.6 1.7 9008
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL11-1 0.97860, 0.97917, 0.91837 SSRL BL11-1
Software
Software Name Purpose Version
PHENIX refinement .
PDB_EXTRACT data extraction 3.00
HKL-2000 data collection .
HKL-2000 data reduction .
HKL-2000 data scaling .
SHELXDE phasing .
RESOLVE phasing .
REFMAC refinement .