X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.0 292 60% Tacsimate, pH 7.0, VAPOR DIFFUSION, SITTING DROP, temperature 292K
Unit Cell:
a: 81.470 Å b: 86.160 Å c: 103.180 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: F 2 2 2
Crystal Properties:
Matthew's Coefficient: 1.92 Solvent Content: 36.09
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 1.300 26.199 43747 1652 98.080 0.154 0.200 17.734
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.210 26.2 96.500 0.048 ? 24.23 4.8 ? 52709 ? ? 16.864
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.21 1.25 79.20 ? ? 1.4 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON MAX II BEAMLINE I911-3 0.9000 MAX II I911-3
Software
Software Name Purpose Version
XSCALE data scaling .
PHASER phasing 2.1.3
PHENIX refinement .
PDB_EXTRACT data extraction 3.005
XDS data scaling .
XDS data reduction .