3HEB

X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 298 0.2 M NaCl, 0.1 M Bis Tris pH 6.5, 25% Peg 3350, 3.0 M NDSB-195, 20 % Glycerol , VAPOR DIFFUSION, SITTING DROP, temperature 298 K
Unit Cell:
a: 40.121 Å b: 75.071 Å c: 48.571 Å α: 90.00° β: 96.41° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.10 Solvent Content: 41.45
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.40 35.21 10607 553 94.1 0.203 0.255 20.3
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
. 50 98.5 0.12 0.12 7.6 6.7 11105 11105 0 0 11.5
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.38 2.47 84.6 ? ? 8.7 6.2 969
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X29A 0.9797 NSLS X29A
Software
Software Name Purpose Version
CBASS data collection .
SHARP phasing .
SHELX model building .
ARP/wARP model building .
CNS refinement 1.1
HKL-2000 data reduction .
SCALEPACK data scaling .
SHELX phasing .