X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 298.0 0.1 M Potassium Thiocyanate, 30% w/v Polyethylene Glycol monomethyl ether 2000, VAPOR DIFFUSION, SITTING DROP, temperature 298.0K
Unit Cell:
a: 46.370 Å b: 90.075 Å c: 77.522 Å α: 90.00° β: 92.39° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 1.99 Solvent Content: 38.07
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 1.61 38.93 80097 4041 97.2 0.185 0.202 11.3
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.61 50.00 99.1 0.065 ? 15.6 7.4 81522 81522 0.0 0.0 19.1
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.61 1.67 100 ? ? 2.0 7.4 8175
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X25 0.9790 NSLS X25
Software
Software Name Purpose Version
HKL-2000 data collection .
SHELX model building .
CNS refinement 1.1
HKL-2000 data reduction .
SCALEPACK data scaling .
SHELX phasing .