X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 293.1 WELL SOLUTION: 20% PEG 4000, 0.2 M SODIUM ACETATE, 0.1 M TRIS HCL PH 8.5, VAPOR DIFFUSION, SITTING DROP, temperature 293.1K
Unit Cell:
a: 40.071 Å b: 54.089 Å c: 40.455 Å α: 90.00° β: 104.84° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.043553 Solvent Content: 39.810699
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.10 22.24 9162 458 97.73 0.19867 0.22767 20.025
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.100 22.24 97.4 ? 0.05000 25.4000 3.2 9717 9717 0 -3.000 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.10 2.18 81.1 ? 0.31500 2.59 2.2 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU FR-E SUPERBRIGHT 1.54178 ? ?
Software
Software Name Purpose Version
SBC-Collect data collection .
PHASER phasing .
REFMAC refinement 5.5.0063
HKL-2000 data reduction .
HKL-2000 data scaling .